SAINT

SAINT integrates raw data frames or images from Siemens two-dimensional detectors (HI-STAR, SMART CDD, X1000, X100) used to collect single crystal X-ray diffraction data extremely rapidly. It provides exceptionally accurate 3-D integrated intensities of each reflection by using Modified Kabsch profiling and absorption and time decay corrections. Output is provided in SHELXTL format for use in small molecule structure determination, and in biological macromolecule least-squares refinement.

Susan Byram

Product Manager
Siemens Industrial Automation, Analyt. Instruments
6300 Enterprise Lane
Madison, WI 53719-1173
USA
608-276-3041
608-276-3006 (fax)

For applications in related solution areas, see the following indices: